TL4C2-101 (PCIE Gen3)
TL4C2-301 (PCIE Gen3)
TL4C2-40x (PCIE Gen4)
TL4C2-50x (PCIE Gen5)
TL4C2-60x (PCIE Gen6)
High reliability performance with Ni plating & wafer to wafer bonding technology.
Various inductor solution application.
Loopback Component with the smallest size in existence
~75% Size compared to Mechanical RF relay
Increased parallelism by minimizing PCB mounting area
No mechanical lifetime issue
Loopback Bandwidth > 40GHz
Application@ATE : PCIE Gen6 & Up to 70Gbps High Speed I/O’s & up to 128Gbps PAM4
Part Number | Data Sheet | Description | Buy/Contact |
---|---|---|---|
TL4C2-101 | 2CH(DIFF) AC Coupled Loopback | ||
TL4C2-301 | |||
TL4C2-302 | |||
TL4-000 | 2CH(DIFF) DC Coupled Loopback | ||
TL4-001 | |||
TL4-300 | |||
TL4-301 |
Part Number | Data Sheet | Description | Buy |
---|---|---|---|
TL4C2-401 | 2CH(DIFF) AC Coupled Loopback | ||
TL4C2-402 | TL4C2-403 | 2CH(DIFF 85ohm) AC Coupled Loopback | |
TL4C2-404 |
Part Number | Data Sheet | Description | Buy |
---|---|---|---|
TL4C2-501 | 2CH(DIFF 100ohm) AC Coupled Loopback | ||
TL4C2-502 | |||
TL4C2-503 | 2CH(DIFF 85ohm) AC Coupled Loopback | ||
TL4C2-504 | |||
TL4-500 | 2CH(DIFF) DC Coupled Loopback |
Part Number | Data Sheet | Description | Buy |
---|---|---|---|
TL4C2-501D | DC + LF Test <10MHz(only) | ||
TL4C2-502D | |||
TL4C2-503D | |||
TL4C2-504D |
Part Number | Data Sheet | Description | Buy |
---|---|---|---|
TL4C2-601D | DC + LF Test <10MHz | ||
TL4C2-602D |
Part Number | Data Sheet | Description | Buy |
---|---|---|---|
TL4R4C4-100 | Display port & MIPI-CSI(transmitter only interface) 4CH Termination |
Part Number | Data Sheet | Description | Buy |
---|---|---|---|
TL-300R-A/B | A : Normally Open Type B : Normally Closed Type |
||
TL-400R-A/B |
Part Number | Data Sheet | Description | Buy |
---|---|---|---|
TA-05 | High Speed I/O Rx Equalizer Stress Component | ||
TA-10 | |||
TA-15 | |||
TA-20 |
An LC Component is used for the Loopback test of High speed I/O ports such as USB, ThunderBolt, PCI, SATA , etc.
In order to test a High-Speed I/O port, ATE s with a high speed channel of several GHz or greater are required. Significant investment of these high speed ATEs are required for mass-production testing. To reduce test costs, most semiconductor manufacturers use a loopback test circuit concept shown below to test high-speed I/O ports.
High-speed mechanical relays typically used in the loopback test, are expensive, space constrained, and short-lived. To overcome this, TSE developed a very compact loopback component by utilizing MEMS technology.