Self-diagnosis functions
Open/short test function
Pin to pin short test function
Common or Individual Type Possible
Pattern generator with 20 or More channels simultaneously lit on Glass.
Electrical Test System
MAX 10,000CH. More
7T1C inspection Function
High-speed interface Tester
Array tester is an inspection equipment that detects and verifies defects through electrical inspection of the TFT array state.
Open / short detection
Aging function
IR detection for Short defects
Improve the yield and stabilize the process
Dual Contact Probe Unit System
TOS System is a device that can find Touch Sensor Panel open and short defects through electrical test.
Single Contact Probe with IR function
Dual Contact Probe without IR function
6G/8G Glass Handling System
AMOLED Cell Circuit Test (7T1C and more)
High-Speed Interface
Implement Fine Align Using Pad Align
A complete set of equipment with Prober and Tester
Array Test System is a device that inspect the AMOLED pixel circuit is normal or not.
8G OLED / LCD Glass Full Contact Test. (Hybrid Glass)
31”~98” Glass Handling Possible
High-Speed Interface
Higher efficiency for Failure Analysis
Auto Probe Change Unit Function
FCA System is a facility for mass production testing of large OLED Products. It is possible to operate the 8G OLED / LCD glass and supports hybrid glass test.
Rigid / Flexible cell Test Function
Auto cell alignment system
Laser marking for a detailed analysis
Cell loading below 6 inches
Various Model Test Possible
CDS7 is system that check cell defects with thermal images.
Thermal Image (applied Voltage)
Volt | Δ T Image | Temp. Graph |
---|---|---|
20V | 4.3mA |
ΔT = 0.01℃ |