Supply customized test solution
Speed X2 ~ X8
Parallel expansion
Command code interface
LUT pattern
Source sync & clock sync schem
Variable mode register setting
Multi firmware configuration
BOST is an optimal solution to suppress the rise of COT caused by increasing the speed and density of memory semiconductors. It will maximize productivity because it contributes to parallel expansion by testing the latest devices using old equipment without adding new facilities.
Target | Tester | Speed | Benefit | Application |
---|---|---|---|---|
LPDDR2 | T5581 / 85 | 800Mbps | Speed up X2 Para ext x4 |
AC, DC, IDD |
LPDDR2 | Magnum 2X | 1066Mbps | Speed up X2 Para ext x4 |
AC, DC, IDD |
DDR3 | T5581 / 85 | 1Gbps | Speed up X2 Para ext x4 |
AC, DC, IDD |
DDR3 | T5581 / 85 | 1600Mbps(DDR) 2133Mbps(SDR) |
Speed up x4~x8 Para ext x4 |
AC, DC, IDD |
DDR4 | T5581 / 85 | 1600Mbps(DDR) 2400Mbps(SDR) |
Speed up x4~x8 Para ext x4 |
AC, DC, IDD |
eMCP (LPDDR2 + eMMC) |
Magnum 2X | 1066Mbps | Speed up X2 Para ext x4 & Concurrent |
AC, DC, IDD |
TE Application : T5581, T5585, T5588, T5593, T5503, Ultra Memory, Magnum
Target Device : DDR3, DDR4, LPDDR3, LPDDR4, GDDR5, GDDR6
Single Ended Input, Differential Output
Given the existing Low Speed Testers, the test environment requires a new high-speed tester as the CLK speed of memories(e.g. DDR3, DDR4, LPDDR3, LPDDR4, GDDR5, GDDR6) increases.
TSE’s CFDS interface solution utilizes existing a Low-Frequency Tester to realize High-Frequency Clock so that it can test a high-speed clock sync memory at a low cost without investing in a new tester.
Test Device | DDR3, DDR4, LPDDR3, LPDDR4, GDDR5 |
Input Voltage | +2.5~5.5V |
Output Voltage | +0.75~3.3V |
Output Current | 2A |
Tracking Voltage | +0.75~3.3V |
Accuracy | ±5mV |
Thicker, thinner and more powerful devices are preferred for easy portability as the center of gravity moves from PC to smartphone.
Low-power DDR products are being developed as a way to reduce power consumption as memories evolve, and a low-power compensation Power Boost Interface Solution is being provided for testing low-power memory products.